Analysis of defect mode in a dielectric photonic crystal ...

In this work, based on the use of ITO as a defect, we study the infrared defect mode in defective photonic crystal made of SiO2 and InP. 跳至主導覽 跳至搜尋 跳過主要內容 AnalysisofdefectmodeinadielectricphotoniccrystalcontainingITOdefect ChiChungLiu,ChienJangWu**此作品的通信作者 光電工程學士學位學程 研究成果:雜誌貢獻›期刊論文›同行評審 13 引文 斯高帕斯（Scopus） 總覽 指紋 摘要 Inthiswork,basedontheuseofITOasadefect,westudytheinfrareddefectmodeindefectivephotoniccrystalmadeofSiO2andInP.DuetothedispersioninthedielectricfunctionofITO,itisfoundthatthedefectmodeissensitivetotheITOthickness.Thedefectfrequencyisshowntobeblue-shiftedasthethicknessofITOdecreases.Intheangulardependenceofdefectmode,itisseenthatthedefectfrequencyisalsoblue-shiftedwhentheangleofincidenceincreasesforbothTEandTMpolarizations.However,theshiftingfeatureisappearedtobenearlypolarization-independent.TheshiftinthedefectfrequencyenablesustoemployITOasatunableagentinordertodesignatunablephotoniccrystalfilterintheinfraredregion. 原文英語頁（從-到）7140-7142頁數3期刊Optik卷125發行號24DOIshttps://doi.org/10.1016/j.ijleo.2014.07.120出版狀態已發佈-201412月1 ASJCScopussubjectareas電子、光磁材料原子與分子物理與光學電氣與電子工程 存取文件 10.1016/j.ijleo.2014.07.120 其它文件與鏈接 LinktopublicationinScopusLinktothecitationsinScopus Photoniccrystals Engineering&MaterialsScience 100% PhotonicCrystal ChemicalCompounds 81% ITO(semiconductors) Physics&Astronomy 66% DielectricMaterial ChemicalCompounds 56% DielectricFunction ChemicalCompounds 48% photonics Physics&Astronomy 44% Defects Engineering&MaterialsScience 43% defects Physics&Astronomy 35% 引用此 APA Standard Harvard Vancouver Author BIBTEX RIS Liu,C.C.,&Wu,C.J.(2014).AnalysisofdefectmodeinadielectricphotoniccrystalcontainingITOdefect.Optik,125(24),7140-7142.https://doi.org/10.1016/j.ijleo.2014.07.120 AnalysisofdefectmodeinadielectricphotoniccrystalcontainingITOdefect./Liu,ChiChung;Wu,ChienJang.於:Optik,卷125,編號24,01.12.2014,p.7140-7142.研究成果:雜誌貢獻›期刊論文›同行評審 Liu,CC&Wu,CJ2014,'AnalysisofdefectmodeinadielectricphotoniccrystalcontainingITOdefect',Optik,卷125,編號24,頁7140-7142.https://doi.org/10.1016/j.ijleo.2014.07.120 LiuCC,WuCJ.AnalysisofdefectmodeinadielectricphotoniccrystalcontainingITOdefect.Optik.201412月1;125(24):7140-7142.https://doi.org/10.1016/j.ijleo.2014.07.120 Liu,ChiChung;Wu,ChienJang./AnalysisofdefectmodeinadielectricphotoniccrystalcontainingITOdefect.於:Optik.2014;卷125,編號24.頁7140-7142. @article{ab47357983c145f997036272695c0386,title="AnalysisofdefectmodeinadielectricphotoniccrystalcontainingITOdefect",abstract="Inthiswork,basedontheuseofITOasadefect,westudytheinfrareddefectmodeindefectivephotoniccrystalmadeofSiO2andInP.DuetothedispersioninthedielectricfunctionofITO,itisfoundthatthedefectmodeissensitivetotheITOthickness.Thedefectfrequencyisshowntobeblue-shiftedasthethicknessofITOdecreases.Intheangulardependenceofdefectmode,itisseenthatthedefectfrequencyisalsoblue-shiftedwhentheangleofincidenceincreasesforbothTEandTMpolarizations.However,theshiftingfeatureisappearedtobenearlypolarization-independent.TheshiftinthedefectfrequencyenablesustoemployITOasatunableagentinordertodesignatunablephotoniccrystalfilterintheinfraredregion.",keywords="Defectmode,ITO,Photoniccrystals,Transfermatrixmethod",author="Liu,{ChiChung}andWu,{ChienJang}",note="FundingInformation:C.-J.WuacknowledgesthefinancialsupportfromtheNationalScienceCouncil(NSC)oftheRepublicofChina(R.O.C.,Taiwan)underContractNo.NSC-100-2112-M-003-005-MY3andfromtheNationalTaiwanNormalUniversityunderNTNU100-D-01.PublisherCopyright:{\textcopyright}2014ElsevierGmbH.Allrightsreserved.",year="2014",month=dec,day="1",doi="10.1016/j.ijleo.2014.07.120",language="English",volume="125",pages="7140--7142",journal="Optik",issn="0030-4026",publisher="UrbanundFischerVerlagJena",number="24",} TY-JOURT1-AnalysisofdefectmodeinadielectricphotoniccrystalcontainingITOdefectAU-Liu,ChiChungAU-Wu,ChienJangN1-FundingInformation: C.-J.WuacknowledgesthefinancialsupportfromtheNationalScienceCouncil(NSC)oftheRepublicofChina(R.O.C.,Taiwan)underContractNo.NSC-100-2112-M-003-005-MY3andfromtheNationalTaiwanNormalUniversityunderNTNU100-D-01. PublisherCopyright: ©2014ElsevierGmbH.Allrightsreserved.PY-2014/12/1Y1-2014/12/1N2-Inthiswork,basedontheuseofITOasadefect,westudytheinfrareddefectmodeindefectivephotoniccrystalmadeofSiO2andInP.DuetothedispersioninthedielectricfunctionofITO,itisfoundthatthedefectmodeissensitivetotheITOthickness.Thedefectfrequencyisshowntobeblue-shiftedasthethicknessofITOdecreases.Intheangulardependenceofdefectmode,itisseenthatthedefectfrequencyisalsoblue-shiftedwhentheangleofincidenceincreasesforbothTEandTMpolarizations.However,theshiftingfeatureisappearedtobenearlypolarization-independent.TheshiftinthedefectfrequencyenablesustoemployITOasatunableagentinordertodesignatunablephotoniccrystalfilterintheinfraredregion.AB-Inthiswork,basedontheuseofITOasadefect,westudytheinfrareddefectmodeindefectivephotoniccrystalmadeofSiO2andInP.DuetothedispersioninthedielectricfunctionofITO,itisfoundthatthedefectmodeissensitivetotheITOthickness.Thedefectfrequencyisshowntobeblue-shiftedasthethicknessofITOdecreases.Intheangulardependenceofdefectmode,itisseenthatthedefectfrequencyisalsoblue-shiftedwhentheangleofincidenceincreasesforbothTEandTMpolarizations.However,theshiftingfeatureisappearedtobenearlypolarization-independent.TheshiftinthedefectfrequencyenablesustoemployITOasatunableagentinordertodesignatunablephotoniccrystalfilterintheinfraredregion.KW-DefectmodeKW-ITOKW-PhotoniccrystalsKW-TransfermatrixmethodUR-http://www.scopus.com/inward/record.url?scp=84910111069&partnerID=8YFLogxKUR-http://www.scopus.com/inward/citedby.url?scp=84910111069&partnerID=8YFLogxKU2-10.1016/j.ijleo.2014.07.120DO-10.1016/j.ijleo.2014.07.120M3-ArticleAN-SCOPUS:84910111069VL-125SP-7140EP-7142JO-OptikJF-OptikSN-0030-4026IS-24ER-